Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-10-17
2011-12-27
Lyons, Michael A (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
08086020
ABSTRACT:
A computer-implemented method for analyzing impurities of an object is provided. The method includes selecting a region from an image of the object, pre-treating the region to calculate a threshold, processing the region and deleting the points from an outer layer of the region. The method further includes setting a starting point and search directions, determining a point before a first boundary point as an origin of the region and searching the next boundary points if the first boundary point has been searched. The method also includes searching all the boundary points in the region, forming an impurity if the last boundary point coincides with the first boundary point, seed filling the impurity and calculating an area value, and comparing the area value with an allowable area value to determine whether the impurity satisfies impurity specifications.
REFERENCES:
patent: 5608816 (1997-03-01), Kawahara et al.
patent: 6567168 (2003-05-01), Nara et al.
patent: 2006/0018530 (2006-01-01), Oaki et al.
Chang Chih-Kuang
Chen Xian-Yi
Hong Yi-Rong
Altis Law Group, Inc.
Hansen Jonathan
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Lyons Michael A
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