Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-15
2008-01-15
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C356S237400
Reexamination Certificate
active
10365997
ABSTRACT:
A system and method to perform analysis on test results of multiple integrated circuits. Based on the analysis, the system and method display a wafer map having map indicators representing statistical values of the test results.
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“Chapter 1: Introduction”,Guide to the ESDA Toolkit, v5.3, TI Proprietary-Internal Data, (1999), 1-12.
Eyolfson Mark
Langworthy Chris
Major Karl L.
Sun Xueqing
Charioui Mohamed
Hoff Marc S.
Micro)n Technology, Inc.
Schwegman Lundberg Woessner & Kluth P.A.
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