Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-15
2008-01-15
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C356S237400
Reexamination Certificate
active
07319935
ABSTRACT:
A system and method to perform analysis on test results of multiple integrated circuits. Based on the analysis, the system and method display a wafer map having map indicators representing statistical values of the test results.
REFERENCES:
patent: 4209257 (1980-06-01), Uchiyama et al.
patent: 4376583 (1983-03-01), Alford et al.
patent: 4778745 (1988-10-01), Leung
patent: 4791586 (1988-12-01), Maeda et al.
patent: 5103166 (1992-04-01), Jeon et al.
patent: 5127726 (1992-07-01), Moran
patent: 5240866 (1993-08-01), Friedman et al.
patent: 5294812 (1994-03-01), Hashimoto et al.
patent: 5301143 (1994-04-01), Ohri et al.
patent: 5497381 (1996-03-01), O'Donoghue et al.
patent: 5539752 (1996-07-01), Berezin et al.
patent: 5544256 (1996-08-01), Brecher et al.
patent: 5550372 (1996-08-01), Yasue
patent: 5760892 (1998-06-01), Koyama
patent: 5841893 (1998-11-01), Ishikawa et al.
patent: 5963314 (1999-10-01), Worster et al.
patent: 6072574 (2000-06-01), Zeimantz
patent: 6081037 (2000-06-01), Lee et al.
patent: 6175417 (2001-01-01), Do et al.
patent: 6185322 (2001-02-01), Ishikawa et al.
patent: 6259520 (2001-07-01), Zeimantz
patent: 6272236 (2001-08-01), Pierrat et al.
patent: 6373566 (2002-04-01), Zeimantz
patent: 6373976 (2002-04-01), Pierrat et al.
patent: 6415977 (2002-07-01), Rumsey
patent: 6417015 (2002-07-01), Nuttall et al.
patent: 6441897 (2002-08-01), Zeimantz
patent: 6452677 (2002-09-01), Do et al.
patent: 6504948 (2003-01-01), Schemmel et al.
patent: 6509750 (2003-01-01), Talbot et al.
patent: 6567168 (2003-05-01), Nara et al.
patent: 6567770 (2003-05-01), Dorough
patent: 6618682 (2003-09-01), Bulaga et al.
patent: 6788993 (2004-09-01), Beffa
patent: 6792373 (2004-09-01), Tabor
patent: 6859760 (2005-02-01), Dorough
patent: 6888159 (2005-05-01), Farnworth et al.
patent: 6890775 (2005-05-01), Simmons
patent: 2004/0036863 (2004-02-01), Matsusita et al.
“Chapter 1: Introduction”,Guide to the ESDA Toolkit, v5.3, TI Proprietary-Internal Data, (1999), 1-12.
Eyolfson Mark
Langworthy Chris
Major Karl L.
Sun Xueqing
Charioui Mohamed
Hoff Marc S.
Micro)n Technology, Inc.
Schwegman Lundberg Woessner & Kluth P.A.
LandOfFree
System and method for analyzing electrical failure data does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for analyzing electrical failure data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for analyzing electrical failure data will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2766962