Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2007-09-11
2011-11-08
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C356S237100, C356S604000, C356S613000, C356S625000, C356S237500, C250S208100, C701S034000
Reexamination Certificate
active
08054471
ABSTRACT:
An optical system including a signal processing unit has been developed to study the contours of objects and/or their deformations. The optical system utilizes projectors comprising an illumination source including those outside the visible range and an observation source such as a digital camera. The optical system provides information regarding the object in such a way that renders a complete description of the surface geometry and/or its deformation. The optical system further facilitates a substantial simplification in obtaining the desired result in the form of eliminating the need for point-wise solution of simultaneous equations. The signal processing unit comprises software that, among others, provides a transformation that mimics projection and observation from infinity. The signal processing unit further reduces data processing by recognizing known geometric shapes, and automatically correcting for discontinuities of the object and/or optical system.
REFERENCES:
patent: 3503690 (1970-03-01), Sciammeralla
patent: 3860346 (1975-01-01), Kersch et al.
patent: 3985444 (1976-10-01), Takashima et al.
patent: 4436419 (1984-03-01), Stetson et al.
patent: 4591996 (1986-05-01), Vachon
patent: 4722600 (1988-02-01), Chiang
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4850693 (1989-07-01), Deason et al.
patent: 4871256 (1989-10-01), Grindon
patent: 5020904 (1991-06-01), McMahan, Jr.
patent: 5085502 (1992-02-01), Womack et al.
patent: 5135308 (1992-08-01), Kuchel
patent: 5953448 (1999-09-01), Liang
patent: 6031612 (2000-02-01), Shirley
patent: 6798527 (2004-09-01), Fukumoto et al.
patent: 2001/0030744 (2001-10-01), Chang
patent: 2007/0146727 (2007-06-01), Coulombe et al.
C.A. Sciammarella, L. Lamberti, and D. Posa, “Techniques to analyze displacements and contouring of surfaces”. Proc. 2007 SEM. (2006).
C.A. Sciammarella and T. Kim, “Frequency modulation interpretation of fringes and computation of strains”, Experimental Mechanics 45, 393-403 (2005).
C.A. Sciammarella, L. Lamberti and F.M. Sciammarella, “High accuracy contouring using projection moiré”, Optical Engineering 44, Paper No. 093605 (12 pages) (2005).
W. Schreiber and G. Notni. “Theory and arrangements of self-calibrating whole-body three-dimensional measurement systems using fringe projection technique”, Opt. Eng. (2000).
C. Reich, R. Ritter and J. Thesing, “shape measurement of complex objects by combining photogrammetry and fringe projection”, Optical Engineering 39, 224-231 (2000).
L. Pirodda, “Principi e applicazioni di un metodo fotogrammetrico basato sull'impiego del moiré”, Rivista Italiana di Ingegneria 12, 1-12 (1969).
R. Weller and B.M. Sheffard, “Displacement measurement by mechanical interferometry”. Proceedings of the Society of Experimental Stress Analysis 6, 35-38 (1948).
P. Dantu, “Détermination expérimentale des flexions dans une plaque plane”, Annales des Ponts et Chaussées 1-40, 272-344 (1940).
Akanbi Isiaka
Chowdhury Tarifur
Law Offices of Michael M. Ahmadshahi
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