System and method for analyzing data

Details System and method for analyzing data System and method for analyzing data

2003-02-28

2009-02-03

Corrielus, Jean M (Department: 2162)

Data processing: database and file management or data structures

Database design

Data structure types

C707S793000, C707S793000, C707S793000

Reexamination Certificate

active

07487148

ABSTRACT:
A system and method for analyzing data (the “system”) is disclosed. The system can automatically identify patterns of template data points encapsulated in the form of one or more “events.” Calculations and analysis relating to those identified events can be automatically performed at the identified locations of the events. Events are user-defined, and can be defined in reference to multiple channels of data. The system can perform various correlation calculations in comparing events with data points. Upon identifying the location of various events in the various data files, markers can be placed at those file locations. Analysis calculations can then be performed related to the marked data. The system can incorporate the automated time-scaling of patterns, marker sorting heuristics, the adjustment of fit sensitivity based on the size of the pattern, target value weighing, and the calculation of various confidence values relating to the processing of the system.

REFERENCES:
patent: 4267562 (1981-05-01), Raimondi
patent: 4495585 (1985-01-01), Buckley
patent: 4559602 (1985-12-01), Bates, Jr.
patent: 4763274 (1988-08-01), Junker et al.
patent: 4817171 (1989-03-01), Stentiford
patent: 4845610 (1989-07-01), Parvin
patent: 5067099 (1991-11-01), McCown et al.
patent: 5099436 (1992-03-01), McCown et al.
patent: 5119816 (1992-06-01), Gevins
patent: 5138587 (1992-08-01), Mason
patent: 5485575 (1996-01-01), Chess et al.
patent: 5769793 (1998-06-01), Pincus et al.
patent: 5846189 (1998-12-01), Pincus
patent: 5916300 (1999-06-01), Kirk et al.
patent: 6064770 (2000-05-01), Scarth et al.
patent: 6092065 (2000-07-01), Floratos et al.
patent: 6151565 (2000-11-01), Lobley et al.
patent: 6154739 (2000-11-01), Wrobel
patent: 6176427 (2001-01-01), Antognini et al.
patent: 6202062 (2001-03-01), Cameron et al.
patent: 6205247 (2001-03-01), Breuer et al.
patent: 6317517 (2001-11-01), Lu
patent: 6421668 (2002-07-01), Yakhini et al.
patent: 7079927 (2006-07-01), Tano et al.
patent: 2001/0014776 (2001-08-01), Oriol et al.
patent: 2004/0073551 (2004-04-01), Hubbard et al.
patent: 1 184 810 (2002-03-01), None
XP- 000936788 Transactions on Pattern Analysis and Machine Intelligence, vol. 22 No. 1 Jan. 2000 entitledStatistical Pattern Recognition: A Reviewby Anil K. Jain, Fellow, IEEE, Robert P.W. Duin, and Jianchang Mao, Senior Member, IEEE.

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