System and method for analyzing a thin bed formation

Details System and method for analyzing a thin bed formation System and method for analyzing a thin bed formation

2005-11-08

2005-11-08

McElheny, Jr., Donald (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Earth science

Reexamination Certificate

active

06963803

ABSTRACT:
One or more high resolution logs of a formation property having thin beds is provided for the laminated formation. From this log, the bed boundaries are detected and the facies for each of the beds detected is identified, using one or more high resolution logs of the laminated formation. Each of the identified facies is then defined. One or more squared logs for formation property is then generated by using the imported volumetric descriptions of the facies to generate a value of the formation property for each of the beds. A reconstructed log is generated and compared with a low resolution log of the formation property for laminated formation. By adjusting the values of the squared log the difference between the reconstructed log and the squared log may be minimized. An optimized squared log is output as having the square log and the volumetric analyses thereon.

REFERENCES:
patent: 5461562 (1995-10-01), Tabanou et al.
patent: 2002/0133323 (2002-09-01), Dahlberg

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