System and method for analyzing a process

Details System and method for analyzing a process System and method for analyzing a process

2011-06-28

2011-06-28

Dam, Tuan Q (Department: 2192)

Data processing: software development, installation, and managem

Software program development tool

Testing or debugging

C717S130000

Reexamination Certificate

active

07971191

ABSTRACT:
The present disclosure relates to a system and method for analyzing a process. Embodiments of the present invention may include obtaining a process execution trace including at least one subtrace, the process execution trace comprising at least one loop repetition. Further, embodiments may include removing loop repetitions within the process execution trace, identifying the subtrace as a point for data collection in a process, and collecting data related to the subtrace.

REFERENCES:
patent: 5276870 (1994-01-01), Shan et al.
patent: 5325525 (1994-06-01), Shan et al.
patent: 5412806 (1995-05-01), Du et al.
patent: 5546571 (1996-08-01), Shan et al.
patent: 5651099 (1997-07-01), Konsella
patent: 5694591 (1997-12-01), Du et al.
patent: 5704053 (1997-12-01), Santhanam
patent: 5729666 (1998-03-01), Konsella et al.
patent: 5732151 (1998-03-01), Moon et al.
patent: 5796752 (1998-08-01), Sun et al.
patent: 5826239 (1998-10-01), Du et al.
patent: 5862381 (1999-01-01), Advani et al.
patent: 5870545 (1999-02-01), Davis et al.
patent: 5909519 (1999-06-01), Gunning et al.
patent: 5937388 (1999-08-01), Davis et al.
patent: 6014673 (2000-01-01), Davis et al.
patent: 6029002 (2000-02-01), Afifi et al.
patent: 6041306 (2000-03-01), Du et al.
patent: 6043816 (2000-03-01), Williams et al.
patent: 6078982 (2000-06-01), Du et al.
patent: 6195377 (2001-02-01), Bell et al.
patent: 6230313 (2001-05-01), Callahan et al.
patent: 6266058 (2001-07-01), Meyer
patent: 6301706 (2001-10-01), Maslennikov et al.
patent: 6308163 (2001-10-01), Du et al.
patent: 6338159 (2002-01-01), Alexander et al.
patent: 6343274 (2002-01-01), McCollom et al.
patent: 6349406 (2002-02-01), Levine et al.
patent: 6463547 (2002-10-01), Bailey et al.
patent: 6463548 (2002-10-01), Bailey et al.
patent: 6467083 (2002-10-01), Yamashita
patent: 6487715 (2002-11-01), Chamdani et al.
patent: 6574001 (2003-06-01), Klosterman et al.
patent: 6609247 (2003-08-01), Dua et al.
patent: 6629108 (2003-09-01), Frey et al.
patent: 6651243 (2003-11-01), Berry et al.
patent: 6675379 (2004-01-01), Kolodner et al.
patent: 6678876 (2004-01-01), Stevens et al.
patent: 6685290 (2004-02-01), Farr et al.
patent: 6688786 (2004-02-01), Brown et al.
patent: 6694453 (2004-02-01), Shukla et al.
patent: 6697089 (2004-02-01), Bryan
patent: 6748583 (2004-06-01), Aizenbud-Reshef et al.
patent: 6751789 (2004-06-01), Berry et al.
patent: 6817010 (2004-11-01), Aizenbud-Reshef et al.
patent: 6817013 (2004-11-01), Tabata et al.
patent: 6862727 (2005-03-01), Stevens
patent: 6971092 (2005-11-01), Chilimbi
patent: 7035206 (2006-04-01), Brewer et al.
patent: 7043668 (2006-05-01), Treue et al.
patent: 7069544 (2006-06-01), Thekkath
patent: 7076776 (2006-07-01), Kim et al.
patent: 7086043 (2006-08-01), Roediger et al.
patent: 7134116 (2006-11-01), Thekkath et al.
patent: 7140008 (2006-11-01), Chilimbi et al.
patent: 7155708 (2006-12-01), Hammes et al.
patent: 7165190 (2007-01-01), Srivastava et al.
patent: 7168066 (2007-01-01), Thekkath et al.
patent: 7174543 (2007-02-01), Schwemmlein et al.
patent: 7185234 (2007-02-01), Thekkath
patent: 7200588 (2007-04-01), Srivastava et al.
patent: 7207035 (2007-04-01), Kobrosly et al.
patent: 7228528 (2007-06-01), Wang et al.
patent: 2002/0010623 (2002-01-01), McCollom et al.
patent: 2002/0087954 (2002-07-01), Wang et al.
patent: 2002/0095666 (2002-07-01), Tabata et al.
patent: 2002/0120918 (2002-08-01), Aizenbud-Reshef et al.
patent: 2002/0181001 (2002-12-01), Klosterman et al.
patent: 2003/0023955 (2003-01-01), Bates et al.
patent: 2003/0041315 (2003-02-01), Bates et al.
patent: 2003/0051231 (2003-03-01), Schwemmlein et al.
patent: 2003/0204513 (2003-10-01), Bumbulis
patent: 2004/0015934 (2004-01-01), Muthukumar et al.
patent: 2004/0088670 (2004-05-01), Stevens et al.
patent: 2004/0088689 (2004-05-01), Hammes
patent: 2005/0071832 (2005-03-01), Kawahito
patent: 2005/0183075 (2005-08-01), Alexander et al.
patent: 2005/0223364 (2005-10-01), Peri et al.
patent: 2005/0246700 (2005-11-01), Archambault et al.
Jidong Long et al., Application of Loop Reduction to Learning Program Behaviors for Anomaly Dectection [online], [retrieved on Mar. 2, 2011], pp. 1-6. Retrieved from the Internet: <URL: http://www.cs.fsu.edu/˜stoeckli/PublicationsVitae/LoopReduction.pdf>.
Abdelwahab Hamou-Lhadj and Timothy C. Lethbridge, A Survey of Trace Exploration Tools and Techniques [online], 2004 [retrieved on Mar. 2, 2011], pp. 1-14. Retrieved from the Internet: <URL: http://users.encs.concordia.ca/˜abdelw/secret/AkanshaAgarwal/HamouLhadj-CASCON04-HamouLethSurveyCameraReady.pdf>.

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