Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-10-03
2006-10-03
Mancuso, Joseph (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S242000
Reexamination Certificate
active
07116823
ABSTRACT:
The present invention includes a method for analyzing an image wherein elements defining a path within a two-dimensional image are received from a prescreener. A Sobel operator may be applied to the region around each of the elements of the chain to obtain a corresponding array of gradient directions. An angle correction may be applied to any of the gradient directions that goes beyond the highest value (in radian measure; the Pi −Pi transition), to obtain an array of gradient directions free of any artificial jumps in value. The gradient direction array (Sobel chaincode) can have its bandwidth taken to determine a single number of straightness so as to identify extremely straight edges, (manmade objects) from less straight edges (natural objects). A similar process can be used to analyze contours for straight sections, which are also parallel. These two and other filters applied to the gradient array can be part of a feature suite, for feature space analysis.
REFERENCES:
patent: 4323880 (1982-04-01), Lucas
patent: 4499598 (1985-02-01), Chittineni
patent: 4628532 (1986-12-01), Stone et al.
patent: 4712248 (1987-12-01), Hongo
patent: 4731858 (1988-03-01), Grasmueller et al.
patent: 4783828 (1988-11-01), Sadjadi
patent: 5033099 (1991-07-01), Yamada et al.
patent: 5036544 (1991-07-01), Sakaue et al.
patent: 5265173 (1993-11-01), Griffin et al.
patent: 5341439 (1994-08-01), Hsu
patent: 5479526 (1995-12-01), Benton et al.
patent: 5604822 (1997-02-01), Pearson et al.
patent: 5644386 (1997-07-01), Jenkins et al.
patent: 5809171 (1998-09-01), Neff et al.
patent: 5825922 (1998-10-01), Pearson et al.
patent: 5867118 (1999-02-01), McCoy et al.
patent: 5937078 (1999-08-01), Hyland et al.
patent: 5943442 (1999-08-01), Tanaka et al.
patent: 5978507 (1999-11-01), Shackleton et al.
patent: 5982930 (1999-11-01), Neff et al.
patent: 6005978 (1999-12-01), Garakani
patent: 6072889 (2000-06-01), Deaett et al.
patent: 6084989 (2000-07-01), Eppler
patent: 6094508 (2000-07-01), Acharya et al.
patent: 6118886 (2000-09-01), Baumgart et al.
patent: 6141433 (2000-10-01), Moed et al.
patent: 6141460 (2000-10-01), Amer et al.
patent: 6154567 (2000-11-01), McGarry
patent: 6173066 (2001-01-01), Peurach et al.
patent: 6178264 (2001-01-01), Kamatani
patent: 6181815 (2001-01-01), Marugame
patent: 6195459 (2001-02-01), Zhu
patent: 6411733 (2002-06-01), Saund
patent: 6748110 (2004-06-01), Wallack
patent: 6954550 (2005-10-01), Fujieda
patent: 2003/0118245 (2003-06-01), Yaroslavsky et al.
patent: 0 505 077 (1992-09-01), None
patent: 1157991 (1996-07-01), None
patent: WO 90/15400 (1990-12-01), None
patent: WO 99/23444 (1999-05-01), None
patent: WO 02/29712 (2002-04-01), None
United States Patent Application entitledSystem and Method for Image Analysis Using a Chaincode,by Clark, et al., filed Jul. 10, 2002.
United States Patent Application entitledSystem and Method for Template Matching of Candidates within a Two-Dimensional Image,by Clark, et al., filed Jul. 10, 2002.
“High Accuracy Feature Extraction Using Chain Code in Gray-Value Images,” IBM Technical Disclosure Bulletin, vol. 31, No. 1, Jun. 1988, New York, pp. 268-269.
Jahne B., “Digitale Bildverarbeitung, Kanten,” Springer-Verlag, 2001, pp. 333-356.
Lewis G. Minor, “Application of Pattern Recognition and Image Processing Techniques to Lock-on-After-Launch Missile Technology,” US Army Missile Laboratory, Alabama, Apr. 5, 1981, pp. 460-464.
D. C. Douglas Hung, et al., “Subpixel Edge Estimation Using Geometrical Edge Models With Noise Miniaturization,” Proceedings of the IEEE Southwest Symposium, Dallas, USA, Apr. 1994, pp. 112-117.
Joon-Woong Lee, et al., “Extraction of Line Features in a Noisy Image,” Pattern Recognition Society, Elsevier Science Ltd., Great Britain, 1997, pp. 1651-1660.
H. Freeman, “On the Encoding of Arbitrary Geometric Configurations,” IRE Transactions on Electronic Computers, Jun. 1961, pp. 260-268.
European Search Report issued for EP 03 25 3013, dated Dec. 10, 2004.
Rummel, P., “A Model-Based Visual Sensor System for Complex Industrial Scenes,” Siemens Forsch-u. Entwickl-Ber. Bd. 13, No. 3, 1984, pp. 151-154.
Belongie, S. et al., “Matching Shapes,” Department of Electrical Engineering and Computer Sciences, University of California, 2001, pp. 454-461.
European Search Report issued for eP 03 25 2990, dated Dec. 15, 2004, 3 pages.
D. Juvin et al., “ANIMA (Analyses of Images) a Quasi Real Time System,” Proceedings-IEEE Computer Society Conference on Pattern Recognition and Image Processing. 1982, pp. 358-361 & 598.
European Search Report issued for EP 03 25 3159, dated Dec. 15, 2004.
L. O'Gorman, “Primitives Chain Code,”AT&T Bell Laboratories, New Jersey, IEEE, 1988, pp. 792-795.
A. Rosenfeld et al., “Digital Picture Processing,” Academic Press, New York, US, Aug. 1960, pp. 132-139 (XP-002308718).
Aboutalib Omar
Clark Walter D.
Su Liya
Fulbright & Jaworski LLP
Mancuso Joseph
Northrop Grumman Corporation
Yuan Kathleen
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