System and method for aligning an inspection probe and maintaini

Details System and method for aligning an inspection probe and maintaini System and method for aligning an inspection probe and maintaini

1993-03-12

1995-05-23

Snow, Walter E.

Electricity: measuring and testing

Magnetic

With compensation for test variable

324227, 324238, G01N 2772, G01N 2782, G01R 3300

Patent

active

054184576

ABSTRACT:
A system and method is provided for aligning a scanning surface of an inspection probe relative to a workpiece surface under inspection. The probe preferably includes at least three alignment eddy current elements, each producing a respective spacing indication electrical signal in accordance with a spacing between each alignment eddy current element and the workpiece. The system further comprises processing means which receives each spacing-indication electrical signal so as to generate data indicative of the relative alignment between the scanning surface of the probe and the workpiece surface. A controller is responsive to the alignment data for aligning the probe such that in operation the scanning surface thereof is substantially parallel relative to the workpiece surface. The probe can include inspection eddy current elements, in which case the alignment and the inspection eddy current elements can be fabricated to form an integral eddy current inspection probe.

REFERENCES:
patent: 4641092 (1987-02-01), Sakamoto et al.
patent: 4675502 (1987-06-01), Haefner et al.
patent: 4783695 (1988-11-01), Eichelberger et al.
patent: 4843318 (1989-06-01), Greenblatt et al.
patent: 4849693 (1989-07-01), Prince et al.
patent: 5161413 (1992-11-01), Junker et al.
patent: 5182513 (1993-01-01), Young et al.

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