Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1993-08-23
1995-01-31
Snow, Walter E.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
33324C, 324668, G01R 2726
Patent
active
053861965
ABSTRACT:
A system (10) accurately measures the resistivity of a material (12) via capacitive coupling without contact with the material (12). A transmission electrode (14a) sends signals through the material (12) to a reception electrode (14b). An oscillation mechanism (16) forwards a periodic signal at a predetermined frequency f to the electrode (14a), and a detection mechanism (18) receives a resistivity signal from the electrode (14b), which signal is proportional to the resistivity of the material (12), and translates the resistivity signal into a resistivity value for the material (12). The oscillation mechanism (16) comprises an oscillator (21) connected through a transformer (T1) to a quarter-wavelength stub (24), which feeds an excitation signal to the transmission electrode (14a). The detection mechanism (18) comprises a detector (31) connected via a transformer (T2) to a quarter-wavelength stub (26), which is directly connected to the reception electrode (14b). The detector demodulates the resistivity signal, which can then be displayed on a user interface, such as resistivity meter (32). The stubs (24, 26) prevent transfer of signals between the electrodes (14a, 14b) when no material (12) is present. Further, the system (10) is constructed so that it resonates at the predetermined frequency f.
REFERENCES:
patent: 2948850 (1960-08-01), Ederer
patent: 2997672 (1961-08-01), Reinsmith
patent: 3234460 (1966-02-01), Baird
patent: 3735247 (1973-05-01), Harker
patent: 3771069 (1973-11-01), Levacher et al.
patent: 3800248 (1974-03-01), Speiser et al.
patent: 3959723 (1976-05-01), Wagner
patent: 4002996 (1977-01-01), Klebanoff et al.
patent: 4234844 (1980-11-01), Yukl
patent: 4476430 (1984-10-01), Wright et al.
patent: 4853617 (1989-08-01), Douglas et al.
patent: 4924172 (1990-05-01), Holmgren
patent: 4950935 (1990-08-01), Furukawa
patent: 4987391 (1991-01-01), Kusiak, Jr.
patent: 5005019 (1991-04-01), Zaghloul et al.
patent: 5103181 (1992-04-01), Gaisford et al.
patent: 5132617 (1992-07-01), Leach et al.
patent: 5177445 (1993-01-01), Cross
patent: 5210500 (1993-05-01), Pingel et al.
Campbell Richard H.
Jones Dennis R.
Lutz James E.
Overholser Denys D.
Denmar, Inc.
Regan Maura K.
Snow Walter E.
LandOfFree
System and method for accurate contactless measurement of the re does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for accurate contactless measurement of the re, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for accurate contactless measurement of the re will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1104660