Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-01
2006-08-01
Pert, Evan (Department: 2826)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C257S048000, C438S017000
Reexamination Certificate
active
07084660
ABSTRACT:
A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.
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Ackaret Jerry D.
Bhend Richard B.
Heidel David F.
Jones, legal representative Jane
Sanda Naoko Pia
Breedlove, Esq. Jill M.
Cutter, Esq. Lawrence D.
Heslin Rothenberg Farley & & Mesiti P.C.
International Business Machines - Corporation
Pert Evan
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