Image analysis – Learning systems
Reexamination Certificate
2007-10-23
2007-10-23
Mehta, Bhavesh M (Department: 2624)
Image analysis
Learning systems
C382S156000, C382S157000, C382S161000, C382S181000, C382S187000, C382S224000
Reexamination Certificate
active
11327913
ABSTRACT:
A system and method facilitating pattern recognition is provided. The invention includes a pattern recognition system having a convolutional neural network employing feature extraction layer(s) and classifier layer(s). The feature extraction layer(s) comprises convolutional layers and the classifier layer(s) comprises fully connected layers. The pattern recognition system can be trained utilizing a calculated cross entropy error. The calculated cross entropy error is utilized to update trainable parameters of the pattern recognition system.
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Platt Jonathan
Simard Patrice Y.
Steinkraus David Willard
Amin Turocy & Calvin LLP
Mehta Bhavesh M
Microsoft Corporation
Strege John B
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