Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-04-19
2011-04-19
Bui, Bryan (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S106000, C702S180000, C375S224000, C375S226000, C375S371000, C331S002000, C331S011000
Reexamination Certificate
active
07930120
ABSTRACT:
A system and circuit for determining data signal jitter via asynchronous sampling provides a low cost and production-integrable mechanism for measuring data signal jitter. The data signal is edge-detected and sampled by a sampling clock of unrelated frequency the sampled values are collected in a histogram according to a folding of the samples around a timebase. The timebase is determined by sweeping to detect a minimum jitter for the folded data. The histogram for the correct estimated timebase period is representative of the probability density function of the location of data signal edges and the jitter characteristics are determined by the width and shape of the density function peaks. Frequency drift can be corrected by adjusting the timebase used to fold the data across the sample set.
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Cranford, Jr. Hayden C.
Gebara Fadi H.
Schaub Jeremy D.
Bui Bryan
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris Atty at Law, LLC
Toub Libby Z.
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