System and carrier for testing semiconductor integrated circuit

Details System and carrier for testing semiconductor integrated circuit System and carrier for testing semiconductor integrated circuit

1993-08-02

1995-03-07

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3128

Patent

active

053961854

ABSTRACT:
A plurality of semiconductor integrated circuit devices are mounted on a film carrier. First electrical connecting sections and first electrical wiring sections for electrically connecting the first electrical connecting sections to the semiconductor integrated circuit devices are provided on the film carrier. Second and third electrical connecting sections and second electrical wiring sections are provided on a film-like probe for electrical characteristic test. The second electrical connecting sections are provided in position corresponding to the first electrical connecting sections of the film carrier. The third electrical connecting sections are used to supply electrical signals to the exterior or derive an electrical signal to the exterior and check the electrical signal. The second electrical wiring sections electrically connects the second and third electrical connecting sections to each other. When the test is effected, the film-like probe and the film carrier are superposed on each other so as to set the second electrical connecting sections of the film-like probe into contact with the first electrical connecting sections of the film carrier. The electrical characteristic test of the semiconductor integrated circuit devices are effected by supplying electrical signals necessary for the electrical characteristic test of the semiconductor integrated circuit devices from the exterior via the third electrical connecting sections or deriving the electrical signals to the exterior and checking the electrical signals.

REFERENCES:
patent: 3493858 (1970-02-01), Baron et al.
patent: 3838984 (1974-10-01), Crane et al.
patent: 4380805 (1983-04-01), Proebeting
patent: 4386389 (1983-05-01), Probeting
patent: 4701781 (1987-10-01), Sankhagowit
patent: 4705606 (1987-11-01), Young et al.
patent: 4808769 (1989-02-01), Nakano et al.
patent: 4949155 (1990-08-01), Tajima et al.
patent: 5008614 (1991-04-01), Shreeve et al.

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