System and apparatus for electrically testing lead-to-lead...

Details System and apparatus for electrically testing lead-to-lead... System and apparatus for electrically testing lead-to-lead...

2007-08-22

2010-06-15

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S549000, C324S719000, C324S765010, C438S018000

Reexamination Certificate

active

07737703

ABSTRACT:
Built-in electrical test structures are measured for lead-to-lead shorting during the fabrication of MR elements on a wafer. The test structures are fabricated in the same fashion as the MR elements, however, the active sensor region or track width is omitted from the test structures. Thus, the left and right leads for each test structure are electrically isolated from each other in their “track width” region. If there is lead-to-lead shorting on a test structure, then the left and right leads are electrically connected in the track width region. A simple resistance measurement between the left and right leads determines the extent of any lead shorting by giving a quantitative resistance value.

REFERENCES:
patent: 3681682 (1972-08-01), Cox, et al.
patent: 5087884 (1992-02-01), Brannon
patent: 5390420 (1995-02-01), Schultz
patent: 5457381 (1995-10-01), Farwell
patent: 5465186 (1995-11-01), Bajorek et al.
patent: 5508614 (1996-04-01), Garfunkel et al.
patent: 5589777 (1996-12-01), Davis et al.
patent: 5774291 (1998-06-01), Contreras et al.
patent: 5991121 (1999-11-01), Kanda
patent: 6362634 (2002-03-01), Jarvis et al.
patent: 6370763 (2002-04-01), Watanuki et al.
patent: 6400534 (2002-06-01), Klaassen
patent: 6411100 (2002-06-01), Takasu
patent: 6483298 (2002-11-01), Heim et al.
patent: 6576923 (2003-06-01), Satya et al.
patent: 6678127 (2004-01-01), Hsiao et al.
patent: 6718621 (2004-04-01), Hayashi et al.
patent: 6731110 (2004-05-01), Church
patent: 6895346 (2005-05-01), Hamamura et al.
patent: 6921672 (2005-07-01), Satya et al.
patent: 6972576 (2005-12-01), Lyons et al.
patent: 2003/0199110 (2003-10-01), Hamamura et al.

Affiliated with

Also associated with

Rating

System and apparatus for electrically testing lead-to-lead... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and apparatus for electrically testing lead-to-lead..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and apparatus for electrically testing lead-to-lead... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4237716