Synthetic test circuit for a metal encapsulated high voltage cir

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 54, G01R 3102, G01R 3114

Patent

active

041479750

ABSTRACT:
A synthetic test circuit for testing a metal-encapsulated high voltage circuit breaker of a type which is grounded on one side and which includes several switching gaps arranged in series. The testing circuit includes a high voltage source and a high current source for stressing the switching gaps during testing and, in addition, a high voltage means for applying a high voltage to the encapsulation simultaneously with the application thereto of a further voltage from the high voltage source. The high voltage is chosen to be of opposite polarity to the further voltage and the encapsulation is insulated from ground potential during application thereof.

REFERENCES:
patent: 2752590 (1956-06-01), Towle
patent: 2888639 (1959-05-01), Petermichl et al.
patent: 2898548 (1959-08-01), Slamecka et al.
patent: 3064183 (1962-11-01), Slamecka
patent: 4001674 (1977-01-01), Schneider

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Synthetic test circuit for a metal encapsulated high voltage cir does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Synthetic test circuit for a metal encapsulated high voltage cir, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Synthetic test circuit for a metal encapsulated high voltage cir will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1748560

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.