Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-10-02
2007-10-02
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S022000, C702S032000, C422S050000, C422S052000, C422S051000
Reexamination Certificate
active
11268417
ABSTRACT:
A method for generating a synthetic data signal is described. A synthetic data signal having any desired duration is generated from a data signal and a background signal of shorter duration. The duration of the background signal is extended by sampling the background signal at random times and for random durations. The sampled background signal is used to extend the background signal. Event data is identified from the data signal. The extended background signal is randomly populated with event data randomly sampled from the data signal to generate the synthetic data signal.
REFERENCES:
patent: 6692696 (2004-02-01), Alberte
Medhi Benna et al., Generation of 3-D synthetic data for modeling of the CONSERT experiment (The radiotomgraphy of comet 67P/Churyumov-Gerasimenko), IEEE, vol. 52, No. 3, Mar. 2004, pp. 709-716.
Robert w. Lowdermilk et al., Signal condition and data collection in synthetic instruments, IEEE, Jul. 2003, pp. 426-431.
Cabalo Jerry B.
Sickenberger David W.
Sickenberger Richard
Barlow John
Biffoni Ulysses John
United States of America as represented by the Secretary of the
Vo Hien
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