Synchronization technique for forming a substantially stable...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state

Reexamination Certificate

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C438S940000, C219S121690

Reexamination Certificate

active

07396706

ABSTRACT:
A specially shaped laser pulse energy profile characterized by different laser wavelengths at different times of the profile provides reduced, controlled jitter to enable semiconductor device micromachining that achieves high quality processing and a smaller possible spot size.

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English Abstract and Purported English Translation of Japanese Publication No. 63-005891.

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