Synchronization of multiple test instruments

Details Synchronization of multiple test instruments Synchronization of multiple test instruments

2006-08-29

2006-08-29

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

C702S121000, C702S152000, C714S704000, C714S707000

Reexamination Certificate

active

07099792

ABSTRACT:
A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.

REFERENCES:
patent: 4849702 (1989-07-01), West et al.
patent: 6067648 (2000-05-01), Hunter et al.
patent: 2003/0105607 (2003-06-01), Jones et al.

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