Symbol rate testing method based on signal waveform analysis

Details Symbol rate testing method based on signal waveform analysis Symbol rate testing method based on signal waveform analysis

2011-06-07

2011-06-07

Payne, David C. (Department: 2611)

Pulse or digital communications

Testing

Reexamination Certificate

active

07957459

ABSTRACT:
A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits1and a plurality of quasi bits0is received and sampled within an acquiring time. Maximum values of the quasi bits1are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit1is a bit1or not is determined according to the critical value, and a total number of the bits1within the acquiring time is counted. Similarly, a number of the bits0within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.

REFERENCES:
patent: 6377618 (2002-04-01), Prasad et al.
patent: 2001/0055334 (2001-12-01), Tiedemann, Jr. et al.
patent: 2003/0063583 (2003-04-01), Padovani et al.
patent: 2005/0201491 (2005-09-01), Wei
patent: 00418081 (2001-01-01), None

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