Switching arrangement method and apparatus for making parameter

Details Switching arrangement method and apparatus for making parameter Switching arrangement method and apparatus for making parameter

1991-03-25

1992-09-08

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Piezoelectric crystal testing

324652, 324649, G01R 2700

Patent

active

051461749

ABSTRACT:
A monolithic coupled-dual resonator crystal filter coupled to improve switching arrangements is tested using both resonator ports to quickly measure selected resonator parameters useful in frequency adjustment, production and test systems as well as accurately measuring other filter crystal parameters, all without requiring removal of the crystal structure from the test fixture.

REFERENCES:
patent: 3963982 (1976-06-01), Roberts
patent: 3992760 (1976-11-01), Roberts
patent: 4093914 (1978-06-01), Peppiatt et al.
patent: 4433316 (1984-02-01), Roberts et al.
patent: 4477952 (1984-10-01), Creszenzi et al.
patent: 4484158 (1984-11-01), Roberts et al.
patent: 4627379 (1986-12-01), Roberts et al.
patent: 4676993 (1987-06-01), Roberts et al.
patent: 4725771 (1988-02-01), Sauerland
patent: 4733164 (1988-03-01), Sauerland
patent: 4833430 (1989-05-01), Roberts et al.
patent: 4839618 (1989-06-01), Roberts et al.
"A Four-Frequency Process for Accurately Measuring Coupled-Dual Resonator Crystals", Roberts, Proc. 33rd Ann. Symp. on Freq. Contr., May 1979, pp. 159-165.
"The Four-Frequency Process for Coupled Duals Using Error-Corrected S-Parameter Measurements", Roberts, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol. 35, No. 3, May 1988, pp. 306-314.

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