Switches bidirectionally connecting external lead to PLL...

Details Switches bidirectionally connecting external lead to PLL... Switches bidirectionally connecting external lead to PLL...

2006-12-29

2009-08-04

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

C324S076530, C331S016000

Reexamination Certificate

active

07570043

ABSTRACT:
An integrated circuit, a phase locked loop, a voltage tune probe and a method of screening an integrated circuit employing a phase locked loop thereof. In one embodiment, the integrated circuit includes: (1) an input/output port configured to provide an external interface lead for the integrated circuit, (2) a phase locked loop having a voltage tune line coupled to a voltage controlled oscillator and (3) a voltage tune probe having a first switch coupled to a second switch and a capacitor coupled therebetween. The first switch is coupled to the voltage tune line and the second switch is coupled to the input/output port. The switches provide a bidirectional connection between the external interface lead and the voltage tune line.

REFERENCES:
patent: 5745011 (1998-04-01), Scott
patent: 6292522 (2001-09-01), Jeng et al.
patent: 6611176 (2003-08-01), Goldman
patent: 7061223 (2006-06-01), Boerstler et al.
patent: 7265633 (2007-09-01), Stiff
patent: 2004/0263146 (2004-12-01), Boerstler et al.
patent: 2008/0111636 (2008-05-01), Tanis

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