Switchable load for testing a semiconductor integrated circuit d

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Parallel controlled paths

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Details

327308, 327334, 327437, 326 34, H03K 1764

Patent

active

060086831

ABSTRACT:
A loading device for use in a tester for testing a semiconductor integrated circuit device (DUT) includes a programmable voltage source for providing a selected voltage at an output terminal thereof and multiple resistive elements each having at least a first state, in which the resistive element is conductive, and a second state, in which the resistive element is substantially non-conductive. The resistive elements are connected as a two-terminal network between the output terminal of the programmable voltage source and a tester pin for connection to a pin of the DUT. A selection device selects the state of each resistive element, whereby the resistance between the output terminal of the programmable voltage source and the tester pin can be selectively varied.

REFERENCES:
patent: 4500845 (1985-02-01), Ehni
patent: 4855685 (1989-08-01), Hochschild
patent: 5117130 (1992-05-01), Shoji
patent: 5162672 (1992-11-01), McMahan et al.
patent: 5194765 (1993-03-01), Dunlop et al.
patent: 5254883 (1993-10-01), Horowitz et al.

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