Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1994-02-07
1995-05-30
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324 7627, 36472406, 36457101, 333203, 333166, G01R 2316
Patent
active
054205140
ABSTRACT:
The sweep rate limitations that heretofore have constrained the maximum sweep rates of swept analysis instruments are obviated by optimizing filter circuitry and post-processing the IF signal using various techniques to compensate for errors caused by fast sweeping. Some selective windowing is also used to compensate for distortions due to fast sweep rates.
REFERENCES:
patent: 2897442 (1959-07-01), Wright
patent: 4686457 (1987-08-01), Banno
patent: 5117179 (1992-05-01), Wardle
patent: 5168213 (1992-12-01), Wardle
patent: 5300878 (1994-04-01), Wardle
Gibbs John A.
Potter Ronald W.
Wardle Jay M.
Hewlett--Packard Company
Solis Jose M.
Wieder Kenneth A.
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