Swept aperture flying spot profiler

Details Swept aperture flying spot profiler Swept aperture flying spot profiler

1985-05-31

1987-02-24

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

250560, 356 1, 356376, 364556, G01B 1100, G01C 320

Patent

active

046459170

ABSTRACT:
A flying spot system uses a laser beam scanned in X and Y directions to provide surface profile information. The beam is applied to a surface under test and the time interval between the beginning of the sweep and the appearance of the beam image through an aperture is determined. This time interval is indicative of the beam angle which, through optical triangulation, is used to determine the surface height. A scan-descan arrangement and a plate with a small aperture are used to isolate a light detector from background light.

REFERENCES:
patent: 3757125 (1973-09-01), Okada et al.
patent: 3782827 (1974-01-01), Nisenson et al.
patent: 4146926 (1979-03-01), Clerget et al.
patent: 4158507 (1979-06-01), Himmel
patent: 4311384 (1982-06-01), Keene
patent: 4336997 (1982-06-01), Ross et al.
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4355904 (1982-10-01), Balasubramanian
patent: 4484069 (1984-11-01), Brenholdt

Affiliated with

Also associated with

Rating

Swept aperture flying spot profiler does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Swept aperture flying spot profiler, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Swept aperture flying spot profiler will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-110307