Sweeping process for mass spectrometer having superimposed field

Details Sweeping process for mass spectrometer having superimposed field Sweeping process for mass spectrometer having superimposed field

1985-02-04

1986-05-13

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250296, 250282, H01J 4932

Patent

active

045888892

ABSTRACT:
A process of obtaining spectra of daughter ions which are produced by collision of sample ions with neutral molecules for dissociating the sample ions in a collision chamber disposed in an ion path to thereby provide a structural analysis of organic compounds. To carry out this process, a mass spectrometer is used which has mass spectrometric units located before and after the collision chamber. The spectrometric unit located behind the chamber has superimposed magnetic field B and electric field E perpendicular to the magnetic field. Daughter ions having a mass m.sub.x produced from parent ions having a mass m.sub.0 inside the chamber are detected and measured by sweeping the voltage Vd.sub.x for producing the electric field or the intensity B.sub.x of the magnetic field singly or sweeping both in an interrelated manner so as to satisfy the relation ##EQU1## where V.sub.00 is the voltage for producing the electric field used to detect the parent ions having infinitely large masses, B.sub.0 is the intensity of the magnetic field when the parent ions are detected, and M.sub.00 is the mass of the parent ions detected when the intensity of the electric field is zero.

REFERENCES:
patent: 3984682 (1976-10-01), Matsuda
patent: 4521687 (1985-06-01), Naito

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