Sweeping photoreflectance spectroscopy

Details Sweeping photoreflectance spectroscopy Sweeping photoreflectance spectroscopy

1991-08-06

1992-12-15

Rosenberger, Richard A.

Optics: measuring and testing

For light transmission or absorption

356 44, G01N 2155, G01N 2184

Patent

active

051721910

ABSTRACT:
A sweeping photoreflectance spectroscopy technique and apparatus is disclosed. This technique and apparatus enable the determination of the band structure of semi conductors and other materials at low temperatures by the mechanism of modulating the photoreflectance signal in a predetermined manner thereby enabling its detection in the presence of a much larger, but continuous, undesirable photoluminescence signal.

REFERENCES:
patent: 4952063 (1990-08-01), Opsal et al.
patent: 4953983 (1990-09-01), Bottka et al.
patent: 5074669 (1991-12-01), Opsal
"New Normalization Procedure for Modulation Spectroscopy" by H. Shen, P. ayanthal, Y. F. Liu, and Fred H. Pollak, Rev. Sci. Instrumentation, p. 1429-1432, Aug. 1987.
"Sweeping photoreflectance spectroscopy of semiconductors" by H. Shen and M. Dutta, Appl. Phys. Lett 57, pp. 587-589, Aug. 6, 1990.

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