Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2004-03-25
2009-02-24
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S124000, C702S076000, C702S107000, C324S076190, C324S076220, C324S076230, C324S076520, C725S117000, C725S118000
Reexamination Certificate
active
07496480
ABSTRACT:
System and method for specifying a signal analysis function. First user input is received, e.g., to a graphical user interface (GUI), indicating a parameter for a first operation implementing at least a portion of the function. The first operation is programmatically included in a sweep loop. Second user input is received specifying a sweep configuration for a sweep on the parameter. The signal includes signal data, e.g., signal plot data or tabular data. The sweep configuration includes: a range of values for the indicated parameter, a number of iterations for the sweep, an interpolation type, step size for the sweep on the indicated parameter, specific values in the range of values for the parameter, source for at least some of the sweep configuration, and/or resultant data. The sweep is performed on the parameter per the sweep configuration, generating resultant data which is stored, and optionally displayed, e.g., in the GUI.
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Cifra Christopher G.
Fletcher J. Clinton
Joffrain Philippe G.
Moriat Alain G.
Pasquarette John A.
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
Tsai Carol S
Williams Mark S.
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