Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2005-01-18
2005-01-18
Fourson, George (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257S009000, C257S014000, C257S024000, C257S030000, C257S036000, C438S197000, C438S299000, C438S585000
Reexamination Certificate
active
06844566
ABSTRACT:
The present invention provides a single-electron transistor device (100). The device (100) comprises a source (105) and drain (100) located over a substrate (115) and a quantum island (120) situated between the source and drain (105, 110), to form tunnel junctions (125, 130) between the source and drain (105, 110). The device (100) further includes a movable electrode (135) located adjacent the quantum island (120) and a displaceable dielectric (140) located between the moveable electrode (135) and the quantum island (120). The present invention also includes a method of fabricating a single-electron device (200), and a transistor circuit (300) that include a single-electron device (310).
REFERENCES:
R.H. Klunder, “Circuit Design with Metallic Single-Electron Tunnel Junctions”, PhD Thesis Tu Del., ISBN 90-9016412-X, 2002.
H. Inokawa, A. Fujiwara and Y. Takahashi, “A Multiple-Valued Logic with Merged Single-Electron and MOS Transistors”: Technical Digest of the IEDM, 2001, pp. 147-150.
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C. Wasshuber, “Computational Single-Electronics”; Springer Verlag., ISBN 321183558x, 2001.
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Christoph Wasshuber, “Recent Advances and Future Prospects in Single-Electronics”; To be Presented at Design Automation Conferences, Anaheim, CA, Jun. 4, 2003.
Brady III Wade James
Fourson George
Maldonado Julio J.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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