Susceptor, vapor phase growth apparatus, epitaxial wafer...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C117S088000, C117S090000, C117S098000

Reexamination Certificate

active

10493144

ABSTRACT:
A susceptor (10) supporting a semiconductor substrate (W) in a vapor phase growth, wherein a pocket (11) is formed on an upper surface of the susceptor to arrange the semiconductor substrate (W) inside thereof. The pocket (11) has a two-stage structure having an upper stage pocket (11a) for supporting an outer peripheral edge portion of the semiconductor substrate (W) and a lower stage pocket (11b) formed on a lower stage of a center side from the upper stage pocket (11a). A hole (12) penetrated to a rear surface of the susceptor and opened in the vapor phase growth is formed in the lower stage pocket (11b).

REFERENCES:
patent: 6129047 (2000-10-01), Nakamura
patent: 6444027 (2002-09-01), Yang et al.
patent: 2001/0037761 (2001-11-01), Ries et al.
patent: A 62-73621 (1987-04-01), None
patent: A 4-78130 (1992-03-01), None
patent: U 5-33523 (1993-04-01), None
patent: A 8-8198 (1996-01-01), None
patent: WO 01/86034 (2001-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Susceptor, vapor phase growth apparatus, epitaxial wafer... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Susceptor, vapor phase growth apparatus, epitaxial wafer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Susceptor, vapor phase growth apparatus, epitaxial wafer... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3785868

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.