Surveying apparatus and method of analyzing measuring data

Details Surveying apparatus and method of analyzing measuring data Surveying apparatus and method of analyzing measuring data

2007-07-16

2009-02-24

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

C382S199000

Reexamination Certificate

active

07496471

ABSTRACT:
Embodiments of the invention relate to a method for minimizing the influence of disturbing signals during calculation of shape elements from coordinate points. An aim of the embodiments of the invention is to exclude the coordinates which are not to be locally assigned to the desired shaped element from the calculation of the shaped element. Said aim is achieved by combining compensation methods for calculating the desired type of shaped element with recognition methods for the same type of shaped element and using the recognition methods for filtering the coordinate points that are relevant for calculating the shaped element out of all input coordinate points.

REFERENCES:
patent: 5616905 (1997-04-01), Sugiyama
patent: 5991437 (1999-11-01), Migdal et al.
patent: 6757571 (2004-06-01), Toyama

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