Survey objective

Patent

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Details

G02B 2102, G02B 1500

Patent

active

044511264

ABSTRACT:
The invention relates to a survey objective for microscopes particularly for the fast changeover from a survey observation of considerable large object fields with high imaging quality to microscopic imaging through objectives of conventional magnification. The invention survey objective is a bipartite lens system, constituted of a first lens member mounted on the lens turret in unit with the microscope objectives also mounted thereupon, and a second lens member switchably arranged in the microscope tube.

REFERENCES:
patent: 3572885 (1971-03-01), Amberg

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