Data processing: generic control systems or specific application – Generic control system – apparatus or process – Optimization or adaptive control
Reexamination Certificate
2005-07-12
2005-07-12
Patel, Ramesh (Department: 2121)
Data processing: generic control systems or specific application
Generic control system, apparatus or process
Optimization or adaptive control
C700S028000, C700S031000, C700S040000, C700S046000, C700S047000, C700S048000, C706S014000, C706S015000, C706S016000, C701S002000, C701S003000, C701S011000, C701S013000, C702S179000, C702S182000, C702S183000
Reexamination Certificate
active
06917839
ABSTRACT:
A system and method which partitions a parameter estimation model, a fault detection model, and a fault classification model for a process surveillance scheme into two or more coordinated submodels together providing improved diagnostic decision making for at least one determined operating mode of an asset.
REFERENCES:
patent: 4295128 (1981-10-01), Hashemian et al.
patent: 4478783 (1984-10-01), Broadwater
patent: 4761748 (1988-08-01), Le Rat et al.
patent: 4937763 (1990-06-01), Mott
patent: 4975968 (1990-12-01), Yukl
patent: 5009833 (1991-04-01), Takeuchi et al.
patent: 5223207 (1993-06-01), Gross et al.
patent: 5274572 (1993-12-01), O'Neil et al.
patent: 5381140 (1995-01-01), Kuroda et al.
patent: 5392320 (1995-02-01), Chao
patent: 5402521 (1995-03-01), Niida et al.
patent: 5410492 (1995-04-01), Gross et al.
patent: 5459675 (1995-10-01), Gross et al.
patent: 5465321 (1995-11-01), Smyth
patent: 5506794 (1996-04-01), Lange
patent: 5586066 (1996-12-01), White et al.
patent: 5602886 (1997-02-01), Gross et al.
patent: 5629872 (1997-05-01), Gross et al.
patent: 5661735 (1997-08-01), Fischer
patent: 5680409 (1997-10-01), Qin et al.
patent: 5706321 (1998-01-01), Chen et al.
patent: 5740033 (1998-04-01), Wassick et al.
patent: 5745382 (1998-04-01), Vilim et al.
patent: 5761090 (1998-06-01), Gross et al.
patent: 5764509 (1998-06-01), Gross et al.
patent: 5774379 (1998-06-01), Gross et al.
patent: 5774569 (1998-06-01), Waldenmaier
patent: 5864773 (1999-01-01), Barna et al.
patent: 5877999 (1999-03-01), Holt et al.
patent: 5950147 (1999-09-01), Sarangapani et al.
patent: 5987399 (1999-11-01), Wegerich et al.
patent: 5991525 (1999-11-01), Shah et al.
patent: 6016465 (2000-01-01), Kelly
patent: 6073262 (2000-06-01), Larkin et al.
patent: 6107919 (2000-08-01), Wilks et al.
patent: 6119111 (2000-09-01), Gross et al.
patent: 6131076 (2000-10-01), Wegerich et al.
patent: 6181975 (2001-01-01), Gross et al.
patent: 6202038 (2001-03-01), Wegerich et al.
patent: 6240372 (2001-05-01), Gross et al.
patent: 6246972 (2001-06-01), Klimasauskas
patent: 6415276 (2002-07-01), Heger et al.
patent: 6421667 (2002-07-01), Codd et al.
patent: 6442663 (2002-08-01), Sun et al.
patent: 6466858 (2002-10-01), Adibhatla et al.
patent: 6502085 (2002-12-01), Adibhatla et al.
patent: 6532412 (2003-03-01), Adibhatla et al.
patent: 6535865 (2003-03-01), Skaaning et al.
patent: 6539783 (2003-04-01), Adibhatla
patent: 6553334 (2003-04-01), Gross et al.
patent: 6556939 (2003-04-01), Wegerich
patent: 6839655 (2005-01-01), Gross et al.
patent: 2001/0049590 (2001-12-01), Wegerich
patent: 2002/0042692 (2002-04-01), Gross et al.
patent: 2002/0055826 (2002-05-01), Wegerich et al.
patent: 2002/0087290 (2002-07-01), Wegerich et al.
patent: 2002/0091499 (2002-07-01), Wegerich et al.
patent: 2002/0128731 (2002-09-01), Wegerich et al.
patent: 2002/0133320 (2002-09-01), Wegerich et al.
patent: 2002/0152056 (2002-10-01), Herzog et al.
patent: 2002/0183971 (2002-12-01), Wegerich et al.
patent: 2002/0188423 (2002-12-01), Gross et al.
patent: 2002/0193933 (2002-12-01), Adibhatla et al.
patent: 2003/0028349 (2003-02-01), Gross et al.
patent: 2003/0055607 (2003-03-01), Wegerich et al.
Bickford, R.L., Phase Partioning the Multivariate State Estimation Technique (MSET) Process for Improved Paramenter Estimation Performance and Processing Speed, New Technology Report, Jan. 13, 2000, Printed in USA by Expert Microsystems, Inc.
Herzog, J.P., System Classification Using A Learning Vector Quantization (LVQ) Neural Network New Technology Report, Jan. 13, 2000, Printed in USA by Argonne National Laboratory.
Herzog, J.P., et al, MSET Modeling of Crystal River-3 Venturi Flow Meters, 6th International Conference on Nuclear Engineering, 1998, Printed in USA by ASME.
Herzog, J.P., et al. Dynamics Sensor Validation For Reusable Launch Vehicle Propulsion, 34th AIAA/ASME/SAE/ASEE Joint Propulsion Conference, 1998, Printed in USA by Argonne National Laboratory & Expert Microsystems.
Gross, K.C., et al, Application of a Model-based Fault Detection System to Nuclear Plant Signals, International Conference on Intellegent System Application To Power Systems, Jul. 1997,Printed in USA by Argonne National Laboratory & Florida Power Corporation.
Singer, R.M., et al, Model-Based Nuclear Power Plant Monitoring And Fault Detection: Theoretical Foundations, International Conference On Intelligent Systems, Jul. 1997, Printed in USA by Argonne National Laboratory.
Hylko, J.M., New AI Technique Detects Instruments, Power, Nov. 1998, Printed in USA by Power.
Deyst, J.J., Sensor Validation: Method To Enhance The Quality Of The Man/Machine Interface in Nuclear Power Stations, IEEE Transactions On Nuclear Science, Feb. 1981, Printed in USA by IEEE Transactions On Nuclear Science.
Gross, K.C., et al, Sequential Probability Ratio Test For Nuclear Plant Component Surveillance, Nuclear Technology, 1990, Printed in USA by Argonne National Laboratory.
Racz, A., Comments On The Sequential Probability Ratio Testing Methods, Ann. Nuclear Energy, 1995, Printed in USA by KFKI-Atomic Energy Research Institute Applied Reactor Physics Laboratory.
Kulacsy, K., Further Comments On The Sequential Probability Ratio Testing Methods, Annals Of Nuclear Energy, 1996, Printed in USA by KFKI Atomic Energy Research Institute.
Bickford, R.L., et al, Real-Time Space Shuttle Main Engine Sensor. Validation, National Aeronautics and Space Administration, Aug. 1995, Printed in USA by ExperTech & Intelligent Software Associates, Inc.
Bickford, R.L., et al, Real-Time Flight Data Validation For Rocket Engines, AIAA, 1996, Printed in USA by ExperTech & NYMA, Inc.
Bickford, R.L., et al, Real-Time Sensor Validation for Autonomous Flight Control, AIAA, Jul. 1997, Printed in USA by Expert Microsystems, Inc. & Intelligent Software Associates, Inc. & Beoing Defense and Space Group.
Bickford, R.L., et al, Real-Time Sensor Validation For Propulsion Systems, American Institute of Aeronautics and Astronautics, 1998, printed in USA by Expert Microsystems, Inc & Dynacs Engineering Co.
Bickford, R.L., et al, Real-Time Sensor Data Validation For Space Shuttle Main Engine Telemetry Monitoring, AIAA, Jun. 1999, Printed in USA by Expert Microsystems, Inc.& Intelligent Software Associates, Inc. & Dynacs Engineering Company & NASA Glenn Research Center.
Mott, J.E., et al, EBR-II System Surveillance Using Pattern Recognition Software, ANS/ENS Mtg. on Operability of Nuclear Power Systems, Sep. 1986, Printed in USA by Saratoga Engineering Consultants and Argonne National Laboratory.
Mott, J.E., et al, A Generalized System State Analyzer for Plant Surveillance, ANS/ENS Mtg. on Artificial Intelligence Applications in the Nuclear Industry, Aug. 1987 Printed in USA by El International, Inc. and Argonne National Laboratory.
Mott, J.E., et al, Pattern-Recognition Software for Plant Surveillance, ANS Transactions, 1987, Printed in USA by the American Nuclear Society.
Mott, J.E., et al, Pattern-Recognition Software for Plant Surveillance, ANS Intl. Mtg. on Nuclear Power Plant Operation, Aug. 1987, Printed in USA by El International, Inc. and Argonne National Laboratory.
Mott, J.E., et al, Pattern-Recognition Software Detecting the Onset of Failures In Complex Systems, 42nd Mtg. of Mech. Failures Prevention Group, Sep. 1987, Printed in USA by El International, Inc. and Argonne National Laboratory.
King, R.W., et al, Pattern-Recognition System Application to EBR-II Plant-Life Extension, ANS Mtg. on Nuclear Power Plant Life Extention, Jul. 1988, Printed in USA by Argonne National Laboratory and El International, Inc.
Singer, R.M., et al, Use of a Pattern Recognition Scheme to Compensate for Critical Sensor Failures, 1st Intl. Machinery Monitoring and Diagnostic Conf., Sep. 1989, Printed in USA by Argonne National Laboratory.
Mott, J.E., et al, A Universal, Fault Tolerant, Non-Linear Analytic Network for Modeling and Fault Detection, 8th Power Plant Dynamics, Control & Testing Symposium, May 1992, Printed in USA by Advanced Modeling Techniques Corporation and Argonne National Laboratory.
Mo
DeBoo Dennis A.
Intellectual Assets LLC
Patel Ramesh
LandOfFree
Surveillance system and method having an operating mode... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surveillance system and method having an operating mode..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surveillance system and method having an operating mode... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3372298