Surfactant slurry additives to improve erosion, dishing, and...

Abrasive tool making process – material – or composition – With inorganic material – Clay – silica – or silicate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C106S003000, C438S692000, C438S693000

Reexamination Certificate

active

10611233

ABSTRACT:
Slurries and methods for the chemical mechanical polishing of high density copper interconnects in a low k ILD are presented. In a particular embodiment of the present invention, a slurry for polishing copper is formed by combining a surfactant comprising an alkyl ethoxy organic acid such as glycolic acid ethoxylate lauryl ether (GAELE), an abrasive such as silica, an oxidizing agent such as hydrogen peroxide, and a chelating buffer system such as citric acid and potassium citrate dissolved in the mixture. This slurry provides a very low incidence of bent line defects, a low erosion rate, and a low dishing rate on a substrate comprising high density copper interconnects in a low k ILD. Embodiments of methods of the present invention use the disclosed slurries.

REFERENCES:
patent: 6143707 (2000-11-01), Trinh et al.
patent: 6413869 (2002-07-01), Achuthan et al.
patent: 6498134 (2002-12-01), Scheibel et al.
patent: 2001/0008828 (2001-07-01), Uchikura et al.
patent: 2002/0039982 (2002-04-01), Foley et al.
patent: 2002/0093002 (2002-07-01), Tsuchiya et al.
patent: 2002/0177318 (2002-11-01), Miller
patent: 2003/0178320 (2003-09-01), Liu et al.
patent: 2004/0147118 (2004-07-01), Liu et al.
Cook, Chemical Processes in Glass Polishing, Journal of Non-Crystalline Solids 120, (1990) pp. 182-171, Galileo Electro-Optics Corp.
Miller, et al., Chemically Induced Defects During Copper Polish, Abstract, Intel Corporation, Hillsboro OR, USA, 5 pages total.
Unknown, Aldrich, Handbook of Fine Chemicals and Laboratory Equipment, Index of documents, Glycine, 2003-2004, total pp. 4.
Ramarajan, et al., Effect of pH and Ionic Strength on Chemical Mechanical Polishing of Tantalum, Electrochemical and Solid-State Letters, pp. 232-234 (2000).
Porter, et al., Handbook of Surfactants, second edition, pp. 98-168, (1994).
Edwards, et al., Inorganic Anions and Copper Pitting, Corrosion Science, May 1994, NACE International, pp. 366-372.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surfactant slurry additives to improve erosion, dishing, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surfactant slurry additives to improve erosion, dishing, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surfactant slurry additives to improve erosion, dishing, and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3796728

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.