Surface strain measuring device

Details Surface strain measuring device Surface strain measuring device

2005-11-23

2008-12-02

Nguyen, Sang (Department: 2886)

Optics: measuring and testing

Material strain analysis

C356S601000, C356S604000, C356S237200, C250S216000, C324S304000

Reexamination Certificate

active

07460216

ABSTRACT:
The device enables strains of at least one surface (1) of a sample (2) to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (1), are measured by composite images. Strains in said plane are measured by image correlation. The measurements by image correlation and by composite images use a common visible light detection camera (3). The sample (2) is arranged in an enclosure (6) transparent at least locally to visible light (L). At least one infrared emitter (9) enables an infrared light to be created in a spectral band for a large part not detected by the camera (3).

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