Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-17
2006-10-17
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S686000, C324S692000
Reexamination Certificate
active
07123026
ABSTRACT:
A surface shape recognition sensor includes capacitive detection elements, support electrode, protective film, and projections. The detection elements are formed from lower electrodes and a deformable plate-like upper electrode made of a metal. The lower electrodes are insulated and isolated from each other and stationarily laid out on a single plane of an interlevel dielectric formed on a semiconductor substrate. The upper electrode is laid out above the lower electrodes at a predetermined interval and has opening portions. The support electrode is laid out around the lower electrodes while being insulated and isolated from the lower electrodes, and formed to be higher than the lower electrodes to support the upper electrode. The protective film is formed on the upper electrode to close the opening portions. The projections per one pixel are laid out in a region of the protective film above the capacitive detection element.
REFERENCES:
patent: 6060756 (2000-05-01), Machida et al.
patent: 6494096 (2002-12-01), Sakai et al.
patent: 11-248 10 (1999-09-01), None
patent: 11-248410 (1999-09-01), None
patent: 2000-199701 (2000-07-01), None
Ishii Hiromu
Kyuragi Hakaru
Machida Katsuyuki
Morimura Hiroki
Sato Norio
Blakely Taylor & Zaffman
Deb Anjan
Nippon Telegraph and Telephone Corporation
Teresinski John
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