Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2011-04-05
2011-04-05
Johnson, Amy Cohen (Department: 2841)
Geometrical instruments
Gauge
Movable contact probe, per se
C033S503000, C702S168000
Reexamination Certificate
active
07918036
ABSTRACT:
In a surface shape measurement device that measures the surface shape of a sample (W1,W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1,W2) and thereby detecting the amount of displacement of the probe (16, 26) caused by irregularities on the surface, an initial amount of displacement is detected which is the amount of displacement of the probe (16, 26) when the probe is first placed in contact with a measurement start point on the surface of the sample (W1,W2), and the amount of displacement of the probe (16, 26), detected as it is moved in a sliding fashion along the surface, is compared with the initial amount of displacement to determine whether the probe (16, 26) has reached a measurement end point.
REFERENCES:
patent: 6460261 (2002-10-01), Noda et al.
patent: 7039550 (2006-05-01), Noda
patent: 7685726 (2010-03-01), Fuchs et al.
patent: 7734445 (2010-06-01), Negishi
patent: 7809523 (2010-10-01), Hunter et al.
patent: 7852031 (2010-12-01), Hon et al.
patent: 2002/0038854 (2002-04-01), Enomoto
patent: 2004/0107073 (2004-06-01), Sakurada et al.
patent: 2010/0217561 (2010-08-01), Mills
patent: 5-34145 (1993-02-01), None
patent: 5-231806 (1993-09-01), None
patent: 2002-107144 (2002-04-01), None
patent: 2004-191365 (2004-07-01), None
patent: 2007-121146 (2007-05-01), None
Patent Abstracts of Japan, Publication No. 05034145 A, Published on Feb. 9, 1993, in the name of Inagaki et al.
Patent Abstracts of Japan, Publication No. 05-231806, Published on Sep. 7, 1993, in the name of Yagi.
Patent Abstracts of Japan, Publication No. 2002-107144, Published on Apr. 10, 2002, in the name of Enomoto.
Patent Abstracts of Japan, Publication No. 2004191365 A, Published on Jul. 8, 2004, in the name of Sakurada et al.
Patent Abstracts of Japan, Publication No. 2007121146 A, Published on May 17, 2007, in the name of Togawa et al.
Christie Parker & Hale LLP
Cohen Johnson Amy
Tokyo Seimitsu Co. Ltd.
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