Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-02-14
1995-12-05
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055923, G01B 1100
Patent
active
054734363
ABSTRACT:
A surface shape measurement device for measuring a surface shape of a measurement subject. The device includes a scanner for scanning the surface of the measurement subject with a light point, a lens for focusing an image of the light point on the surface of the measurement subject and a slit plate arranged at a position of a focal plane of the light point and having a plurality of apertures on a locus of the image of the light point. The device further includes a photoelectric converter arranged at a position to receive the light passing through the aperture for converting the light into a pulse signal and a signal processing circuit connected to receive the pulse signal for determining a position of the light point on the surface of the measurement subject based on a time-point of generation of the pulse signal, whereby the surface shape of the measurement subject is measured based on the position determined by the signal processing circuit.
REFERENCES:
patent: 4939379 (1990-07-01), Horn
Evans F. L.
Kabushiki Kaisha Toshiba
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