Surface shape measurement apparatus and method

Optics: measuring and testing – Lens or reflective image former testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S601000

Reexamination Certificate

active

07907262

ABSTRACT:
Apparatus for indicating the departure of a shape of an object from a specified shape is described. The apparatus includes a light source for directing an incident beam of radiation onto the object, and an inspecting device for inspecting the final beam after transmission by or reflection from the object. The apparatus is arranged so that the final beam will have a substantially planar wavefront when the object has the specified shape, and said inspecting device is arranged to determine any departure of the wavefront of the final beam from planarity. In one embodiment, the inspecting device includes a beamsplitter, for example a diffraction grating or hologram, and a detector such as a CCD camera. The beamsplitter is then arranged to split the final beam into two or more beams and to direct the two or more beams to laterally displaced locations on the detector.

REFERENCES:
patent: 4643576 (1987-02-01), Kanoh et al.
patent: 5062702 (1991-11-01), Bille
patent: 5581347 (1996-12-01), Le Saux et al.
patent: 5675413 (1997-10-01), Prikryl et al.
patent: 5737079 (1998-04-01), Burge et al.
patent: 6344898 (2002-02-01), Gemma et al.
patent: 6750958 (2004-06-01), Fantone et al.
patent: 2002/0159030 (2002-10-01), Frey et al.
patent: 2002/0176090 (2002-11-01), Ohsaki et al.
patent: 2003/0002048 (2003-01-01), Zanoni
patent: 2003/0058433 (2003-03-01), Almogy et al.
patent: 2003/0112426 (2003-06-01), Devie et al.
patent: 2003/0128368 (2003-07-01), Kuchel
patent: 3531904 (1986-03-01), None
patent: 05-146406 (1993-06-01), None
patent: 07-229721 (1995-08-01), None
patent: 2000-227313 (2000-08-01), None
patent: 2003-322587 (2003-11-01), None
patent: 2004-029076 (2004-01-01), None
patent: 03/044455 (2003-05-01), None
patent: WO 03/044456 (2003-05-01), None
patent: WO 03/074985 (2003-09-01), None
International Search Report of PCT/GB2005/000455, mailed Jul. 7, 2005.
GB Search Report of GB0402941.9, dated Jul. 15, 2004.
English translation of Japanese Notice of Rejection (Official Action) mailed Jul. 20, 2010 for JP 2006-552680.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface shape measurement apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface shape measurement apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface shape measurement apparatus and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2765485

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.