Surface scanning method

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

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C116S275000

Reexamination Certificate

active

07665350

ABSTRACT:
The invention relates to a dynamic-mode surface (12) scanning method in which a cantilever (10) provided with a probe (18) is non-positively coupled to the surface and is made to oscillate in a resonant fashion using positive feedback, wherein the resonant oscillation contains at least one higher harmonic whose frequency represents an integer multiple of the basic resonance frequency of the cantilever which is force-coupled to the surface. According to the invention, the amplitude or the phases of the at least one higher harmonic oscillation is determined as a control variable in order to regulate the distance between the probe (18) and the surface (14).

REFERENCES:
patent: 5804709 (1998-09-01), Bourgoin et al.
patent: 6823724 (2004-11-01), Kobayashi et al.
patent: 6906450 (2005-06-01), Tamayo De Miguel et al.
patent: 6935167 (2005-08-01), Sahin et al.
patent: 7107825 (2006-09-01), Degertekin et al.
Frequency Modulation Detection Using High-Q Cantilevers for Enhanced Force Microscope Sensitivity, T.R. Albrecht et al., Journal of Applied Physics, 69 (Jan. 15, 1991), No. 2, pp. 668-673.
Advances in Atomic Force Microscopy, Franz J. Giessibl, Reviews of Modern Physics, vol. 75, No. 3, Jul. 2003, pp. 949-983.
Interaction Sensing in Dynamic Force Microscopy, U Dürig, New Journal of Physics 2, (2000) 5.1-5.12.
Higher Harmonics Imaging in Tapping-Mode Atomic-Force Microscopy, Robert W. Stark and Wolfgang M. Heckl, Rev. Sc. Instrum. 74, (2003) American Institute of Physics, pp. 5111-5114.
Higher-Harmonics Generation in Tapping-Mode Atomic-Force Microscopy: Insights Into the Tip-Sample Interaction, R. Hillenbrand et al., Appl. Phys. Lett., 2000 American Institute of Physics, pp. 3478-3480.
Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid, S. John T. Van Noort et al., Langmuir, 1999 American Chemical Society, pp. 7101-7107.
Spectroscopy of Higher Harmonics in Dynamic Atomic Force Microscopy, Robert W. Stark, Institute of Physics Publishing, Nanotechnology 15 (2004), pp. 347-351.
Ultrasonic Atomic Force Microscope With Overtone Excitation of Cantilever, Kazushi Yamanaka and Shizuka Nakano, Jpn. J. Appl. Phys., vol. 35, (1996), pp. 3787-3792.
Tip Motion in Amplitude Modulation (Tapping-Mode) Atomic-Force Microscopy: Comparison Between Continuous and Point-Mass Models, Tomas R. Rodriquez and Ricardo Garcia, Appl. Phys. Lett. 80, 2002 American Institute of Physics, pp. 1646-1648.

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