Surface scan measuring instrument, surface scan measuring...

Details Surface scan measuring instrument, surface scan measuring... Surface scan measuring instrument, surface scan measuring...

2006-05-02

2006-05-02

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S167000

Reexamination Certificate

active

07039550

ABSTRACT:
A surface scan measuring instrument is provided with: a scanning probe (2) that has a probe sensor (24) for detecting a relative position of a measurement point and a workpiece and scans a workpiece surface; a drive mechanism (12) for moving the scanning probe (2); a joystick (32) for inputting an instruction of a direction and a size with a manual operation; a moving vector commander (43) that generates a moving vector having the direction and the size instructed by the joystick (32); an retraction vector commander (51) that automatically generates a retraction vector for commanding a movement in a retraction direction based on a value detected by the probe sensor (24); a scanning vector commander (44) that generates a scanning vector by combining the moving vector and the retraction vector; and a drive control circuit (45) for controlling a drive of the drive mechanism (12) according to the scanning vector.

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patent: 2000-74661 (2000-03-01), None

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