Surface roughness gauge and method

Details Surface roughness gauge and method Surface roughness gauge and method

1980-11-17

1982-12-21

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With light attenuation

356445, 356446, G01B 1130, G01N 2155

Patent

active

043646638

ABSTRACT:
A compact gauge (10) for effectively measuring the surface roughness of an article (14) in any direction of lay includes: first means (30) for directing a light beam (32) upon a surface (12) of the article (14), second means (34) for providing a first signal proportional to the specular light reflected from the surface (12), the first and second means (30,34) defining a common plane (40), third means (58) for providing a second signal proportional to the diffused light reflected from the surface (12) in the common plane (40), and fourth means (61) for providing a third signal proportional to the diffused light reflected from the surface (12) to the side of the common plane (40). The subject gauge (10) includes a sensor head (28) that can be miniaturized and electrical circuit means (66,104) that can process the signals and provide a direct reading in micrometers independent of the reflectivity level of the surface.

REFERENCES:
patent: 3804521 (1974-04-01), Sprague
patent: 3984189 (1976-10-01), Seki et al.
patent: 4172666 (1979-10-01), Clarke
patent: 4218144 (1980-08-01), Whitehouse et al.

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