Surface quality analysis

Details Surface quality analysis Surface quality analysis

1975-12-01

1978-07-25

Smith, Alfred E.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356200, 356238, 250572, G01N 2130, G01N 2132

Patent

active

041031776

ABSTRACT:
Analysis of the reflectance characteristics of a surface such as a sample of knitted fabric utilizes one or more photosensitive detector means to scan the surface and to automatically produce at least one surface quality signal in response to the reflective characteristics of the surface. In preferred embodiments of the invention a modulated light source is used to illuminate the surface in order to minimize the effect of ambient lighting conditions, and a plurality of detector means are used to obtain a more accurate representation of the quality of the surface being scanned.

REFERENCES:
patent: 3065615 (1962-11-01), Abrams
patent: 3283162 (1966-11-01), Quittner
patent: 3388261 (1968-06-01), Roberts et al.
patent: 3494236 (1970-02-01), Kono et al.
patent: 3534402 (1970-10-01), Crowell et al.
patent: 3729635 (1973-04-01), Shottenfeld
patent: 3781117 (1973-12-01), Laycak et al.
patent: 3841761 (1974-10-01), Selgin
patent: 3892492 (1975-07-01), Eichenberger

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