Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1992-09-21
1995-08-08
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324642, 324644, 324632, 117201, 118712, G01N 2200
Patent
active
054402387
ABSTRACT:
Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.
REFERENCES:
patent: 4800165 (1989-01-01), Tomoki et al.
patent: 4873444 (1989-10-01), Cooke et al.
patent: 5072172 (1991-12-01), Stolarczyk
patent: 5103182 (1992-04-01), Moslehi
patent: 5105157 (1992-04-01), Schmitt
patent: 5216372 (1993-06-01), Zoughi
patent: 5239269 (1993-08-01), Martens
patent: 5241279 (1993-08-01), Boniort
"Confocal Resonators for Measuring the Surface Resistance of High-temperature Superconducting Films" by J. S. Martens, et al., Appl. Phys. Lett. vol. 58, pp. 2543-2545 (1991).
"Morphology Control and High Critical Currents in Superconducting Thin Films in the Tl-Ca-Ba-Cu-O System" by D. S. Ginley, et al., Physica C, vol. 160 pp. 42-48 (1989).
"The Role of Low Temperatures in the Operation of Logic Circuitry" by R. W. Keyes, et al., Proceedings of the IEEE, vol. 58 pp. 1914-1922 (1970).
"The Effects of Processing Sequences on the Microwave Surface Resistance of TlCaBaCuO" by J. S. Martens, et al., J. Appl. Phys. vol. 69, pp. 8268-8271 (1991).
"Hydrogen Plasma Treatment of Silicon Surfaces Studies by In-Situ Spectroscopic Ellipsometry" by P. Raynaud, Applied Surface Science, vol. 46, pp. 435-440 (1990).
"Penetration of Electromagnetic Fields into a Good Conductor" by S. Ramo, et al., Fields and Waves in Communications Electronics, pp. 147-151 (1984).
"Infrared and Optical Masers" by A. L. Schawlow, et al., Physical Revie, vol. 112, pp. 1940-1949 (1958).
"On the Focused Fabry-Perot Resonator in Plasma Diagnostics" by K. E. Lonngren, et al., IEEE Transactions on Microwave Theory and Techniques vol. 58, pp. 548-549 (1964).
"Microwave Surface Resistance of YBa2CU3)6.9 Superconducting Films" by J. S. Martens, et al., Appl. Phys. Lett, vol. 52, pp. 1822-1824 (1988).
Ginley David S.
Hietala Vincent M.
Martens Jon S.
Sorensen Neil R.
Libman George H.
Sandia Corporation
Solis Jose M.
Stanley Timothy D.
Wieder Kenneth A.
LandOfFree
Surface property detection apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface property detection apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface property detection apparatus and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-973994