Surface profile measuring instrument

Details Surface profile measuring instrument Surface profile measuring instrument

2008-01-15

2008-01-15

Fulton, Christopher W (Department: 2859)

Geometrical instruments

Gauge

Movable contact probe, per se

C033S558000

Reexamination Certificate

active

07318285

ABSTRACT:
Provided are a measuring section (210) including a vibrating contact-type probe having a measuring force detection circuit (219) which detects a measuring force acting to the contact portion (212); a moving unit (a three-dimensional drive mechanism (300), a vertical movement drive mechanism (220)) that moves the measuring section (210) relative to a workpiece surface (S); and a drive control unit (400) that controls the moving unit based on the magnitude of the measuring force output from the measuring force detection circuit (219). The drive control unit (400) includes: a scanning-measurement control section (410) that moves for scanning the contact portion along the workpiece surface (S) with the measuring force maintained at the designated scanning measuring force; and a touching-measurement control section (420) that conducts touching-measurements on the workpiece surface (S) in a repeated manner, in the measurements the contact portion (212) being adapted to intermittently contact the workpiece surface (S) at a touch detecting measuring force.

REFERENCES:
patent: 5152072 (1992-10-01), McMurtry et al.
patent: 5625957 (1997-05-01), Breyer et al.
patent: 5952589 (1999-09-01), Leung et al.
patent: 6314800 (2001-11-01), Nishimura
patent: 6434851 (2002-08-01), Nishina
patent: 6457366 (2002-10-01), Hidaka et al.
patent: 6484571 (2002-11-01), Hidaka et al.
patent: 6604295 (2003-08-01), Nishimura et al.
patent: 6901677 (2005-06-01), Smith et al.
patent: 7076883 (2006-07-01), Yamamoto et al.
patent: 2004/0040373 (2004-03-01), Saito
patent: 2005/0204573 (2005-09-01), Kassai et al.
patent: 2000-199710 (2000-07-01), None
patent: 2003-240538 (2003-08-01), None
patent: 2003-294434 (2003-10-01), None
patent: 2004-061322 (2004-02-01), None
patent: 2005-037197 (2005-02-01), None

Affiliated with

Also associated with

Rating

Surface profile measuring instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface profile measuring instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface profile measuring instrument will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2793035