Surface profile measuring apparatus and method

Details Surface profile measuring apparatus and method Surface profile measuring apparatus and method

1981-09-18

1984-03-06

Little, Willis

Geometrical instruments

Area integrators

Electrical

33366, G01B 734

Patent

active

044345585

ABSTRACT:
The difference in elevation between two closely spaced points on a surface is sensed by an instrument that is sequentially positioned at equally spaced locations along a measurement line to provide data from which a surface profile may be plotted. The instrument frame mounts a sensor having a sensitivity axis parallel to a contact line connecting pivot contact points at which the instrument engages the surface to provide a readout adjusted and calibrated to be in terms of vertical distance between the two contact points.

REFERENCES:
patent: 811739 (1906-02-01), Pelfry et al.
patent: 1829257 (1931-10-01), Best et al.
patent: 3816937 (1974-06-01), Burgin
patent: 3835546 (1974-09-01), Jaquet

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