Surface potential measuring system

Details Surface potential measuring system Surface potential measuring system

1990-04-27

1992-09-29

Wieder, Kenneth A.

Electricity: measuring and testing

Electrostatic field

Using modulation-type electrometer

324457, G01R 2912

Patent

active

051516594

ABSTRACT:
In a system for measuring a surface potential of a sample, a probe is located above. A surface of the sample with a small gap and is vibrated by a piezoelectronic element which is energized by a oscillator. A potential of the distal end of the probe is changed and is converted into an electrical signal. The surface potential is obtained from the electrical signal.

REFERENCES:
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patent: 4134137 (1979-01-01), Jacobs et al.
patent: 4147981 (1979-04-01), Williams
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patent: 4878017 (1989-10-01), Williams
Journal of Physics, E: Scientific Instruments, vol. 17, No. 9, Sep. 1984 pp. 788-792.
Instruments & Experimental Techniques, vol. 27, No. 4, Jul./Aug. 1984 pp. 1016-1018, New York, N. T. Yunda, "Meter for the Distribution of Surface Potential".

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