Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1998-03-30
2000-03-07
Font, Frank G.
Optics: measuring and testing
By alignment in lateral direction
With light detector
250548, G01B 1126
Patent
active
060347805
ABSTRACT:
A surface displacement detection apparatus that detects the displacement of a substrate W with respect to a predetermined reference plane (X-Y plane). The apparatus includes an illumination optical system that irradiates light toward a first detection location among N detection locations initially removed from each other on substrate W, wherein N.gtoreq.2. The apparatus also includes a re-illumination optical system that directs light reflected from the first detection location to subsequent detection locations on substrate W so that the light from the illumination optical system impinges on each of the N detection locations. The apparatus further includes a detection optical system that converges the light reflected from the last detection location on substrate W onto a light receiving surface, a photoelectric detection unit that photoelectrically detects the displacement of the light received at the light receiving surface. Information with respect to the displacement of the light from all N detection locations is included in the light that is converged on the light receiving surface by the detection optical system. The detection optical system is separated from the illumination optical system so as to receive light reflected from the second detection location removed from the first detection location.
REFERENCES:
patent: 5216235 (1993-06-01), Lin
patent: 5412214 (1995-05-01), Suzuki et al.
patent: 5416562 (1995-05-01), Ota et al.
patent: 5633721 (1997-05-01), Mizutani
Font Frank G.
Nguyen Tu T.
Nikon Corporation
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