Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-09-30
1998-09-01
Pham, Hoa Q
Optics: measuring and testing
By polarized light examination
With light attenuation
356400, 250548, G01B 1114
Patent
active
058018352
ABSTRACT:
In an apparatus and method for surface position detection, a position of a detection surface is determined by illuminating the detection surface with detection light, receiving detection light from the detection surface, designating different parts of the detection surface in accordance with a structure within an illuminated area on the detection surface, and detecting, based on information of the received light and information of the designated parts of the detection surface, positions corresponding to the designated parts of the detection surface.
REFERENCES:
patent: 4558949 (1985-12-01), Uehara et al.
patent: 4595294 (1986-06-01), Ohki et al.
patent: 4823014 (1989-04-01), Miyawaki
patent: 4902900 (1990-02-01), Kamiya et al.
patent: 5124562 (1992-06-01), Kawashima et al.
patent: 5162642 (1992-11-01), Akamatsu et al.
patent: 5218415 (1993-06-01), Kawashima
Kobayashi Naoyuki
Magome Nobutaka
Mizutani Hideo
Nikon Corporation
Pham Hoa Q
LandOfFree
Surface position detection apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface position detection apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface position detection apparatus and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-275624