Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-05-09
1996-12-24
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356400, 250548, G01B 1100
Patent
active
055877940
ABSTRACT:
A surface position detection apparatus includes a projection optical system for projecting pattern light having a predetermined pattern on a detection surface from an oblique direction to the detection surface, an imaging optical system for forming an image of the pattern light reflected by the detection surface, a light-receiving-side light-shield arranged at a position substantially conjugate with the detection surface in the imaging optical system, and having an opening portion with a predetermined shape, a scanner for scanning the pattern image formed by the imaging optical system relative to the light-receiving-side light-shield, and a detection device for the pattern light into a plurality of portions, and selectively detecting at least one such portion of the pattern light.
REFERENCES:
patent: 4558949 (1985-12-01), Uehara et al.
patent: 4595294 (1986-06-01), Ohki et al.
patent: 4823014 (1989-04-01), Miyawaki
patent: 4902900 (1990-02-01), Kamiya et al.
patent: 5124562 (1992-06-01), Kawashima et al.
patent: 5162642 (1992-11-01), Akamatsu et al.
patent: 5218415 (1993-06-01), Kawashima
Kobayashi Naoyuki
Magome Nobutaka
Mizutani Hideo
Nikon Corporation
Pham Hoa Q.
LandOfFree
Surface position detection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface position detection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface position detection apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1182041